{"title":"Automation of absolute phase/power calibrations applied to real time large signal systems","authors":"I. Volokhine","doi":"10.1109/ARFTG.2010.5496329","DOIUrl":null,"url":null,"abstract":"A nonlinear test set is presented to automate absolute calibrations in an on-wafer real time load pull measurement system featuring time domain capability. The absolute power and phase calibrations are essential steps in any nonlinear system and they require, in general, cumbersome manual procedures. The solution is presented to overcome such laborious and error-prone manual procedures with automated absolute calibrations. It makes preparation for on-wafer nonlinear measurement easy and fast by combining commutation of the signal paths and coaxial standards. It includes a power sensor and phase reference device, which are required for on-wafer absolute calibrations. The automation also improves the accuracy and reproducibility of all nonlinear measurements.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"75th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2010.5496329","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A nonlinear test set is presented to automate absolute calibrations in an on-wafer real time load pull measurement system featuring time domain capability. The absolute power and phase calibrations are essential steps in any nonlinear system and they require, in general, cumbersome manual procedures. The solution is presented to overcome such laborious and error-prone manual procedures with automated absolute calibrations. It makes preparation for on-wafer nonlinear measurement easy and fast by combining commutation of the signal paths and coaxial standards. It includes a power sensor and phase reference device, which are required for on-wafer absolute calibrations. The automation also improves the accuracy and reproducibility of all nonlinear measurements.