Catastrophic and parametric fault modelling for photonic systems

M. Aljada, A. Osseiran, K. Alameh
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Abstract

In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.
光子系统的突变和参数故障建模
在本文中,我们研究了光子系统中最常见的突变和参数故障的影响。我们以光子相关器为例,证明了测试技术在光子系统故障检测中的有效性。据我们所知,这构成了定义故障模型和开发光子系统测试方法的第一次尝试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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