RePRAM: Re-cycling PRAM faulty blocks for extended lifetime

Jie Chen, Guru Venkataramani, H. H. Huang
{"title":"RePRAM: Re-cycling PRAM faulty blocks for extended lifetime","authors":"Jie Chen, Guru Venkataramani, H. H. Huang","doi":"10.1109/DSN.2012.6263950","DOIUrl":null,"url":null,"abstract":"As main memory systems begin to face the scaling challenges from DRAM technology, future computer systems need to adapt to the emerging memory technologies like Phase-Change Memory (PCM or PRAM). While these newer technologies offer advantages such as storage density, non-volatility, and low energy consumption, they are constrained by limited write endurance that becomes more pronounced with process variation. In this paper, we propose a novel PRAM-based main memory system, RePRAM (Recycling PRAM), which leverages a group of faulty pages and recycles them in a managed way to significantly extend the PRAM lifetime while minimizing the performance impact. In particular, we explore two different dimensions of dynamic redundancy levels and group sizes, and design low-cost hardware and software support for RePRAM. Our proposed scheme involves minimal hardware modifications (that have less than 1% on-chip and off-chip area overheads). Also, our schemes can improve the PRAM lifetime by up to 43× (times) over a chip with no error correction capabilities, and outperform prior schemes such as DRM and ECP at a small fraction of the hardware cost. The performance overhead resulting from our scheme is less than 7% on average across 21 applications from SPEC2006, Splash-2, and PARSEC benchmark suites.","PeriodicalId":236791,"journal":{"name":"IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2012.6263950","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

As main memory systems begin to face the scaling challenges from DRAM technology, future computer systems need to adapt to the emerging memory technologies like Phase-Change Memory (PCM or PRAM). While these newer technologies offer advantages such as storage density, non-volatility, and low energy consumption, they are constrained by limited write endurance that becomes more pronounced with process variation. In this paper, we propose a novel PRAM-based main memory system, RePRAM (Recycling PRAM), which leverages a group of faulty pages and recycles them in a managed way to significantly extend the PRAM lifetime while minimizing the performance impact. In particular, we explore two different dimensions of dynamic redundancy levels and group sizes, and design low-cost hardware and software support for RePRAM. Our proposed scheme involves minimal hardware modifications (that have less than 1% on-chip and off-chip area overheads). Also, our schemes can improve the PRAM lifetime by up to 43× (times) over a chip with no error correction capabilities, and outperform prior schemes such as DRM and ECP at a small fraction of the hardware cost. The performance overhead resulting from our scheme is less than 7% on average across 21 applications from SPEC2006, Splash-2, and PARSEC benchmark suites.
RePRAM:回收PRAM故障块以延长使用寿命
随着主存系统开始面临DRAM技术的规模挑战,未来的计算机系统需要适应相变存储器(PCM或PRAM)等新兴存储技术。虽然这些新技术提供了诸如存储密度、非易失性和低能耗等优点,但它们受到写入持久性的限制,这种限制随着工艺变化而变得更加明显。在本文中,我们提出了一种新的基于PRAM的主存系统RePRAM (Recycling PRAM),它利用一组故障页面并以一种有管理的方式回收它们,以显着延长PRAM的使用寿命,同时最大限度地降低性能影响。特别是,我们探索了动态冗余水平和组大小的两个不同维度,并为RePRAM设计了低成本的硬件和软件支持。我们提出的方案涉及最小的硬件修改(芯片上和片外面积开销小于1%)。此外,我们的方案可以在没有纠错功能的芯片上将PRAM寿命提高43倍,并且以一小部分硬件成本优于先前的方案,如DRM和ECP。在来自SPEC2006、Splash-2和PARSEC基准套件的21个应用程序中,我们的方案导致的性能开销平均不到7%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信