{"title":"Extraction of high-frequency equivalent network parameters of HBT's by low-frequency extrapolation of microwave S-parameter data","authors":"E. John, M. B. Das, Li-wu Yang, S. Liu","doi":"10.1109/CORNEL.1993.303079","DOIUrl":null,"url":null,"abstract":"This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT's. The method involves measurements of the device's small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (r/sub bb'/, and r/sub ee'/), the shunt capacitance elements (c/sub j/e, c/sub bc/ and c/sub c/), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects.<<ETX>>","PeriodicalId":129440,"journal":{"name":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1993.303079","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT's. The method involves measurements of the device's small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (r/sub bb'/, and r/sub ee'/), the shunt capacitance elements (c/sub j/e, c/sub bc/ and c/sub c/), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects.<>