A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

Abstract

An approach is proposed to automatic testing of analog electronic circuits using PSpice-like general purpose circuit simulators based on parameterized models of the faulty elements. Using time domain response parameters that well characterize the faults, the set of typical faulty variants of the circuit is simulated. Using post-processing of the obtained results and macro-definitions in the graphical analyzer probe, a diagnosis of parametric faults in the circuit is performed. The models of the faulty elements are defined in the form of parameterized library components for the Cadence PSpice simulator. Examples are given illustrating the proposed approach