Microstructure of erasable optic disk thin film investigated by STM/AFM

Optical Storage and Information Data Storage Pub Date : 1993-08-13 DOI:10.1117/12.150649

Zhanghua Wu, F. Gan

引用次数: 0

Abstract

The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.

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用STM/AFM研究可擦光盘薄膜的微观结构

利用自行设计的扫描隧道显微镜(STM)观察了溅射非晶磁光介质TbFeCo的微观结构，并记录了相变介质中的磁迹。用原子力显微镜对GeSbTe进行了研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Optical Storage and Information Data Storage

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