An Ensemble of Supervised Learning and Image Inpainting for Mura Detection

Chia-Yu Lin, Tzu-Min Chang, Hao-Yuan Chen, Tzer-jen Wei
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Abstract

Mura refers to surface defects or areas of uneven brightness that can occur during factory panel production. Mura can vary in size and shape and be categorized as “light Mura” or “serious Mura.” To optimize the repair process, factories aim to differentiate between the two types of Mura before sending the panels for repair. However, current Mura detection models focus only on identifying “nrmal” and “Mura,” resulting in poor performance in distinguishing between light and serious Mura. To address this issue, we propose an ensemble approach called the Ensemble Image Inpainting and Supervised Modeling Mura Detection System (EISMDS), which combines supervised and image inpainting models to differentiate between the two types of Mura. Experimental results show that our approach improves the True Positive Rate (TPR) by 11 % under a high True Negative Rate (TNR) compared to a single supervised detection model.
基于监督学习和图像绘制的村村检测
Mura是指在工厂面板生产过程中可能出现的表面缺陷或亮度不均匀的区域。村村的大小和形状各不相同,分为“轻村村”和“重村村”。为了优化维修过程,工厂的目标是在将面板送去维修之前区分两种类型的Mura。然而,目前的Mura检测模型只专注于识别“正常”和“Mura”,因此在区分轻度和严重的Mura方面表现不佳。为了解决这个问题,我们提出了一种集成方法,称为集成图像绘制和监督建模村检测系统(EISMDS),它结合了监督和图像绘制模型来区分两种类型的村。实验结果表明,与单一监督检测模型相比,我们的方法在高真阴性率(TNR)下将真阳性率(TPR)提高了11%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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