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Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

European Consortium for Mathematics in Industry Pub Date : 2016-06-13 DOI:10.1007/978-3-319-63082-3_42
P. Putek, R. Janssen, J. Niehof, E. T. Maten, R. Pulch, B. Tasic, M. Günther
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纳米电子耦合问题的解决:RFIC干扰的不确定度量化
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European Consortium for Mathematics in Industry
European Consortium for Mathematics in Industry
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