{"title":"Diffraction Profile Pole Figures Measured with a Position Sensitive Detector","authors":"L. Wcislak, H. Bunge","doi":"10.1155/TSM.26-27.19","DOIUrl":null,"url":null,"abstract":"Pole figures in the classical sense are defined by the integral intensities of Bragg reflections. The conventional technique of pole figure measurement uses a single detector (usually a scintillation counter) with a wide receiving slit where the integral intensity of a given Bragg reflection is obtained directly. The usage of a position sensitive detector instead of a single detector allows to measure whole diffraction profiles simultaneously. Integral intensities of the diffraction peaks can then be obtained mathematically using peak profile analysis both on overlapped (profile deconvolution) and separated (profile fitting) reflections.","PeriodicalId":413822,"journal":{"name":"Texture, Stress, and Microstructure","volume":"241 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Texture, Stress, and Microstructure","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/TSM.26-27.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Pole figures in the classical sense are defined by the integral intensities of Bragg reflections. The conventional technique of pole figure measurement uses a single detector (usually a scintillation counter) with a wide receiving slit where the integral intensity of a given Bragg reflection is obtained directly. The usage of a position sensitive detector instead of a single detector allows to measure whole diffraction profiles simultaneously. Integral intensities of the diffraction peaks can then be obtained mathematically using peak profile analysis both on overlapped (profile deconvolution) and separated (profile fitting) reflections.