Monte Carlo simulation of InAlAs/InGaAs HEMTs with various shape of buried gate

A. Endoh, I. Watanabe, A. Kasamatsu, T. Mimura
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引用次数: 1

Abstract

We carried out Monte Carlo (MC) simulation of In0.52Al0.48As/In0.53Ga0.47As high electron mobility transistors (HEMTs) with various shape of buried gate. Especially, we examined the HEMT with a “realistic” buried gate in which the tip of gate foot is “round.” We found that the “effective” gate length is determined by the length of gate foot tip from the electron velocity profiles and electric field in the channel layer. Furthermore, the “round” tip of gate electrode is convenient to prevent breakdown.
具有不同埋栅形状的InAlAs/InGaAs hemt的蒙特卡罗模拟
采用蒙特卡罗(MC)方法对不同埋栅形状的In0.52Al0.48As/In0.53Ga0.47As高电子迁移率晶体管(HEMTs)进行了模拟。特别是,我们用一个“真实的”埋门来检查HEMT,其中门脚的尖端是“圆形的”。我们发现栅极的“有效”长度是由栅极脚尖端的长度和通道层中的电场决定的。此外,栅极的“圆形”尖端便于防止击穿。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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