{"title":"Scattering parameters of microstrip band pass filter under laser spot illumination","authors":"Y. Horii, M. Tsutsumi","doi":"10.1109/MWP.1996.662153","DOIUrl":null,"url":null,"abstract":"We have demonstrated, in detail, the scattering parameters of an optically controlled microstrip band pass filter fabricated on the semiconductor substrate. Frequency dependence on the transmission characteristics S/sub 21/ are evaluated theoretically, when the plural number of laser spots illuminated both air gaps on this filter. Further, the distribution of the standing waves occurring on the filter have been measured experimentally using the optical probing technique, and the most sensitive position to be controlled optically is discussed.","PeriodicalId":433743,"journal":{"name":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.1996.662153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We have demonstrated, in detail, the scattering parameters of an optically controlled microstrip band pass filter fabricated on the semiconductor substrate. Frequency dependence on the transmission characteristics S/sub 21/ are evaluated theoretically, when the plural number of laser spots illuminated both air gaps on this filter. Further, the distribution of the standing waves occurring on the filter have been measured experimentally using the optical probing technique, and the most sensitive position to be controlled optically is discussed.