Microscope image reconstruction

C. Sheppard
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Abstract

In brightfield, phase-contrast or polarization microscopy, the image can be modeled by using scattering theory. The object, consisting of spatial variations in complex refractive index, scatters components of an angular spectrum of plane waves, and the image calculated by integration over incident and scattered waves. This approach takes into account the high aperture effects, important in microscope imaging. Rigorous methods can be used to calculate the scattering by the object.1 However, these methods, in addition to being in general very computationally intensive, result in the disadvantges that it is difficult to see trends in the behaviour and usually impracticable to reconstruct the object from the image data.
显微镜图像重建
在明场显微镜、相衬显微镜或偏振显微镜中,可以使用散射理论对图像进行建模。该物体由复折射率的空间变化组成,散射平面波的角谱分量,并通过对入射波和散射波的积分计算出图像。这种方法考虑到了显微镜成像中重要的大孔径效应。可以采用严格的方法来计算物体的散射然而,这些方法除了通常计算量非常大之外,还存在难以看到行为趋势和通常无法从图像数据中重建物体的缺点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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