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The Influence of Technological Parameters on Ultra-Short Gate SI-NMOS Transistor Performances

ESSDERC '93: 23rd European solid State Device Research Conference Pub Date : 1993-09-01 DOI:10.1007/978-3-7091-6657-4_75
M. Charef, F. Dessenne, J. Thobel, Laurent Baudry, R. Fauquembergue
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工艺参数对超短栅SI-NMOS晶体管性能的影响
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ESSDERC '93: 23rd European solid State Device Research Conference
ESSDERC '93: 23rd European solid State Device Research Conference
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