Taking atomic force microscope advances to the university classroom

J. Adams, G. Priyadarshan, Ade Mabogunje, L. Leifer, C. Quate, E. Ong, B. Ramakrishna
{"title":"Taking atomic force microscope advances to the university classroom","authors":"J. Adams, G. Priyadarshan, Ade Mabogunje, L. Leifer, C. Quate, E. Ong, B. Ramakrishna","doi":"10.1109/AERO.2001.931453","DOIUrl":null,"url":null,"abstract":"Because of the current and future importance of the Atomic Force Microscope (AFM) in education and research, our team has been working on transferring this technology to the college classroom. In this paper we present the initial findings of a case study in which two years of cutting-edge AFM research was transferred to the college classroom in the form of a one-semester course. The course was developed before the research was completed and published in final form. While, the course centered on the re-creation and explanation of the most recent advances in building high-throughput AFMs, it also implemented and assessed the use of two online AFMs. Student response to the initial course offering, its content, and the tools used, was very positive. The students rated the course above the department average on 14 of the 15 survey metrics and claimed that the teaching method would help them remember more than other classes (average 8 on a ten-point scale. N=24). As a result of the course, several students have shown interest in pursuing work and research in this field. These results indicate that the course has successfully broadened the horizons of undergraduate and graduate students at the University of Nevada Reno, which had no microtechnology or AFM course offering prior to this work. It has also demonstrated the potential of using the AFM as the center focus of a MEMS/Nano-technology course. Finally, this case study may serve as a model for future technology transfer to the classroom by Ph.D. candidates who have not fully completed their technical research.","PeriodicalId":329225,"journal":{"name":"2001 IEEE Aerospace Conference Proceedings (Cat. No.01TH8542)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 IEEE Aerospace Conference Proceedings (Cat. No.01TH8542)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.2001.931453","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Because of the current and future importance of the Atomic Force Microscope (AFM) in education and research, our team has been working on transferring this technology to the college classroom. In this paper we present the initial findings of a case study in which two years of cutting-edge AFM research was transferred to the college classroom in the form of a one-semester course. The course was developed before the research was completed and published in final form. While, the course centered on the re-creation and explanation of the most recent advances in building high-throughput AFMs, it also implemented and assessed the use of two online AFMs. Student response to the initial course offering, its content, and the tools used, was very positive. The students rated the course above the department average on 14 of the 15 survey metrics and claimed that the teaching method would help them remember more than other classes (average 8 on a ten-point scale. N=24). As a result of the course, several students have shown interest in pursuing work and research in this field. These results indicate that the course has successfully broadened the horizons of undergraduate and graduate students at the University of Nevada Reno, which had no microtechnology or AFM course offering prior to this work. It has also demonstrated the potential of using the AFM as the center focus of a MEMS/Nano-technology course. Finally, this case study may serve as a model for future technology transfer to the classroom by Ph.D. candidates who have not fully completed their technical research.
带原子力显微镜走进大学课堂
由于原子力显微镜(AFM)在当前和未来的教育和研究中的重要性,我们的团队一直致力于将这项技术转移到大学课堂上。在本文中,我们介绍了一个案例研究的初步发现,在这个案例研究中,两年的前沿AFM研究以一学期课程的形式转移到大学课堂上。该课程是在研究完成并以最终形式出版之前开发的。虽然,课程集中在重建和解释在构建高通量原子力显微镜的最新进展,它也实施和评估使用两个在线原子力显微镜。学生对最初提供的课程、内容和使用的工具的反应非常积极。在15项调查指标中,学生们对这门课的评分有14项高于系里平均水平,并声称这种教学方法比其他课程更能帮助他们记住东西(满分10分,平均8分)。N = 24)。由于这门课程的结果,一些学生对从事这一领域的工作和研究表现出了兴趣。这些结果表明,该课程成功地拓宽了内华达大学里诺分校本科生和研究生的视野,在此之前,内华达大学里诺分校没有开设微技术或AFM课程。它也展示了使用AFM作为MEMS/纳米技术课程的中心焦点的潜力。最后,本案例研究可以作为未来尚未完全完成技术研究的博士候选人将技术转移到课堂的模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信