Imaging in Short-Wave Infrared with 1.82 μm Pixel Pitch Quantum Dot Image Sensor

Jiwon Lee, Epimitheas Georgitzikis, Yunlong Li, Ziduo Lin, Jihoon Park, I. Lieberman, D. Cheyns, M. Jayapala, A. Lambrechts, S. Thijs, R. Stahl, P. Malinowski
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引用次数: 16

Abstract

A high pixel density image sensor for the Short Wave Infrared (SWIR) range is presented. A PbS quantum dot (QD) photodiode array is monolithically integrated on a silicon custom readout IC. Imaging in VIS and SWIR is demonstrated using focal plane arrays with pixel pitch down to record 1.82 μm. Through-silicon vision and lens-free imaging (LFI) microscopy are shown as applications that can benefit from high resolution/small pixel dimensions. In the LFI demonstration, the captured hologram is computationally reconstructed to acquire SWIR microscopic images, resulting in a wavelength equivalent resolution LFI microscopy system. To our knowledge, this is the smallest pitch SWIR pixel ever reported and the first LFI system using a QD image sensor.
1.82 μm像素间距量子点图像传感器短波红外成像研究
提出了一种用于短波红外(SWIR)范围的高像素密度图像传感器。将PbS量子点(QD)光电二极管阵列单片集成在硅自定义读出IC上。使用焦平面阵列演示了VIS和SWIR成像,像素间距降至1.82 μm。通过硅视觉和无透镜成像(LFI)显微镜显示的应用可以受益于高分辨率/小像素尺寸。在LFI演示中,捕获的全息图被计算重建以获得SWIR显微图像,从而产生波长等效分辨率的LFI显微系统。据我们所知,这是有史以来报道的最小螺距SWIR像素,也是第一个使用QD图像传感器的LFI系统。
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