H. Devarajan, Anthony Kougkas, Prajwal Challa, Xian-He Sun
{"title":"Vidya: Performing Code-Block I/O Characterization for Data Access Optimization","authors":"H. Devarajan, Anthony Kougkas, Prajwal Challa, Xian-He Sun","doi":"10.1109/HiPC.2018.00036","DOIUrl":null,"url":null,"abstract":"Understanding, characterizing and tuning scientific applications' I/O behavior is an increasingly complicated process in HPC systems. Existing tools use either offline profiling or online analysis to get insights into the applications' I/O patterns. However, there is lack of a clear formula to characterize applications' I/O. Moreover, these tools are application specific and do not account for multi-tenant systems. This paper presents Vidya, an I/O profiling framework which can predict application's I/O intensity using a new formula called Code-Block I/O Characterization (CIOC). Using CIOC, developers and system architects can tune an application's I/O behavior and better match the underlying storage system to maximize performance. Evaluation results show that Vidya can predict an application's I/O intensity with a variance of 0.05%. Vidya can profile applications with a high accuracy of 98% while reducing profiling time by 9x. We further show how Vidya can optimize an application's I/O time by 3.7x.","PeriodicalId":113335,"journal":{"name":"2018 IEEE 25th International Conference on High Performance Computing (HiPC)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 25th International Conference on High Performance Computing (HiPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HiPC.2018.00036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Understanding, characterizing and tuning scientific applications' I/O behavior is an increasingly complicated process in HPC systems. Existing tools use either offline profiling or online analysis to get insights into the applications' I/O patterns. However, there is lack of a clear formula to characterize applications' I/O. Moreover, these tools are application specific and do not account for multi-tenant systems. This paper presents Vidya, an I/O profiling framework which can predict application's I/O intensity using a new formula called Code-Block I/O Characterization (CIOC). Using CIOC, developers and system architects can tune an application's I/O behavior and better match the underlying storage system to maximize performance. Evaluation results show that Vidya can predict an application's I/O intensity with a variance of 0.05%. Vidya can profile applications with a high accuracy of 98% while reducing profiling time by 9x. We further show how Vidya can optimize an application's I/O time by 3.7x.