Parallel Mixed Signal Testing as an Embedded Instrument

Abstract

Due to the steady evolution of PXI/PXIe instrumentation and software innovation, standalone parallel ATS capability is now a cost-effective option for the rapid screening and testing of legacy avionic assemblies. By leveraging readily available PXIe stimulus and acquisition assets, a mixed-signal module may be realized for those environments where a full complement of traditional ATS assets is either not physically available or not integrated to the level required for full parallel test. In proposed configurations, packaging options exist that would allow this parallel test capability to be embedded as a supplemental modular instrument into any existing PXIe/VXI chassis. This paper will explore how the proposed modular instrument will independently implement true mixed-signal parallel functional testing (instead of static metrics) integrated with dynamic waveform analysis software for a turnkey solution on any ATS station, as innovated by Advanced Testing Technologies, Inc.