{"title":"COMPUTER SIMULATION OF RESISTIVE SWITCHING IN HFO2 MEMRISTORS","authors":"E. Ganykina, A. Rezvanov, S. Zyuzin, E. Gornev","doi":"10.29003/m3096.mmmsec-2022/148-150","DOIUrl":null,"url":null,"abstract":"The paper presents computer simulation of the formation and rupture of a conductive filament in a hafnium oxide-based memristor using two different approaches: the finite element method and the kinetic Monte Carlo method.","PeriodicalId":151453,"journal":{"name":"Mathematical modeling in materials science of electronic component","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Mathematical modeling in materials science of electronic component","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29003/m3096.mmmsec-2022/148-150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The paper presents computer simulation of the formation and rupture of a conductive filament in a hafnium oxide-based memristor using two different approaches: the finite element method and the kinetic Monte Carlo method.