Recent progress in spin-LED: realization of pure circular polarization EL at room temperature with current density of 10 A/cm2 (Conference Presentation)

Spintronics XII Pub Date : 2019-09-10 DOI:10.1117/12.2527862
N. Nishizawa, H. Munekata
{"title":"Recent progress in spin-LED: realization of pure circular polarization EL at room temperature with current density of 10 A/cm2 \n\n (Conference Presentation)","authors":"N. Nishizawa, H. Munekata","doi":"10.1117/12.2527862","DOIUrl":null,"url":null,"abstract":"Electroluminescence with nearly pure circular polarization (CP) at room temperature (RT) together with electrical helicity control [1, 2] has been demonstrated by a lateral-type spin-polarized light emitting diodes (LT-spin-LEDs) consisting of AlGaAs/GaAs double-heterostructures and the crystalline AlOx (x-AlOx) tunneling barrier [3]. In this LT-spin-LED, relatively high current density of J > 100 A/cm2 was required to achieve the circular polarization of P ~ 0.95. Operation with J > 100 A/cm2, however, often resulted in irreversible breakdown and short-lived spin-LED. In order to suppress this breakdown, we have studied fabrication of LT-spin-LED devices incorporating x-AlOx/AlAs hybrid tunneling barriers. With AlAs layers that are inserted between the x-AlOx layer and a top n-GaAs layer of LT-spin-LED, we aim at reinforcing electrical robustness of x-AlOx layers that are formed by oxidation of Al epilayers at RT. Nearly pure CP emissions (~ 0.92) are obtained from LT-spin-LED devices with hybrid tunneling barriers at J ~ 10 A/cm2. To our surprise, current density for pure CP emission decreases to about one-tenth and the yield of device fabrication is significantly improved (~ 5 % -> ~ 67 %). It is supposed that growth of AlAs layers prior to the formation of x-AlOx layers gives rise to improvement of crystalline quality of x-AlOx layers in terms of suppression of defects in the oxide layer and/or those across x-AlOx/AlAs/n-GaAs interfaces. [1] N. Nishizawa et al., PNAS 114, 1783 (2017). [2] N. Nishizawa et al., APEX 11, 053003 (2018). [3] N. Nishizawa et al., JAP 114, 033507 (2013).","PeriodicalId":420411,"journal":{"name":"Spintronics XII","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spintronics XII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2527862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Electroluminescence with nearly pure circular polarization (CP) at room temperature (RT) together with electrical helicity control [1, 2] has been demonstrated by a lateral-type spin-polarized light emitting diodes (LT-spin-LEDs) consisting of AlGaAs/GaAs double-heterostructures and the crystalline AlOx (x-AlOx) tunneling barrier [3]. In this LT-spin-LED, relatively high current density of J > 100 A/cm2 was required to achieve the circular polarization of P ~ 0.95. Operation with J > 100 A/cm2, however, often resulted in irreversible breakdown and short-lived spin-LED. In order to suppress this breakdown, we have studied fabrication of LT-spin-LED devices incorporating x-AlOx/AlAs hybrid tunneling barriers. With AlAs layers that are inserted between the x-AlOx layer and a top n-GaAs layer of LT-spin-LED, we aim at reinforcing electrical robustness of x-AlOx layers that are formed by oxidation of Al epilayers at RT. Nearly pure CP emissions (~ 0.92) are obtained from LT-spin-LED devices with hybrid tunneling barriers at J ~ 10 A/cm2. To our surprise, current density for pure CP emission decreases to about one-tenth and the yield of device fabrication is significantly improved (~ 5 % -> ~ 67 %). It is supposed that growth of AlAs layers prior to the formation of x-AlOx layers gives rise to improvement of crystalline quality of x-AlOx layers in terms of suppression of defects in the oxide layer and/or those across x-AlOx/AlAs/n-GaAs interfaces. [1] N. Nishizawa et al., PNAS 114, 1783 (2017). [2] N. Nishizawa et al., APEX 11, 053003 (2018). [3] N. Nishizawa et al., JAP 114, 033507 (2013).
自旋led的最新进展:在室温下实现电流密度为10 A/cm2的纯圆偏振EL(会议报告)
由AlGaAs/GaAs双异质结构和晶体AlOx (x-AlOx)隧道势垒[3]组成的横向型自旋偏振发光二极管(LT-spin-LEDs)已经证明了室温下具有近纯圆偏振(CP)和电螺旋控制的电致发光[1,2]。在这种lt自旋led中,要实现P ~ 0.95的圆极化,需要较高的电流密度J > 100 A/cm2。然而,以j> 100 A/cm2运行,经常导致不可逆击穿和短寿命的自旋led。为了抑制这种击穿,我们研究了结合x-AlOx/AlAs混合隧道势垒的lt自旋led器件的制造。通过在lt -自旋led的x-AlOx层和顶部n-GaAs层之间插入AlAs层,我们的目标是增强由Al层氧化形成的x-AlOx层的电稳健性。在J ~ 10 a /cm2的混合隧道势垒中,lt -自旋led器件获得了接近纯CP发射(~ 0.92)。令我们惊讶的是,纯CP发射的电流密度降低到约十分之一,器件制造的收率显着提高(~ 5% -> ~ 67%)。假设在x-AlOx层形成之前,AlAs层的生长可以抑制氧化物层和/或x-AlOx/AlAs/n-GaAs界面上的缺陷,从而改善x-AlOx层的晶体质量。[10] N. Nishizawa等,PNAS 114, 1783(2017)。[10] N. Nishizawa等,生物工程学报,11,053003(2018)。[10] N. Nishizawa等,中国生物医学工程学报(英文版),2013,33(2):555 - 557。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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