Comparative Assessment of GaN as a Microwave Source with Si and SiC for Mixed Mode Operation at Submillimetre Wave Band of Frequency

P. Panda, S. Padhi, G. Dash
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引用次数: 1

Abstract

The potentials of GaN, SiC, and Si for application as microwave sources in mixed tunnelling avalanche transit time mode operation at submillimetre wave (sub-mm wave) frequency around 0.35 terahertz (THz) are investigated using some computer simulation methods. Design criteria to choose width, doping concentration, and area are highlighted. From the results of our simulation we observed that the Si diode produces the least power output of 41 mW followed by the GaN diode with 760 mW and the SiC diode with 2.89 W. In addition, the GaN diode has more noise than the SiC diode (by 5 dB) as well as the Si diode (by 10 dB). The drastically different performance between the GaN and the SiC diode is attributed to the incorporation of disparate carrier velocity in GaN which were not being used by other authors. In spite of the low power and high noise of the GaN compared to the SiC diode, the presence of several peaks in the mean square noise voltage curves and the existence of several minima in the noise measure curves would open a new direction in the design of GaN low-noise ATT diodes capable of multifrequency tuning like a DAR diode.
GaN与Si和SiC作为微波源在亚毫米波频段混合模式工作的比较评价
利用计算机模拟方法研究了GaN、SiC和Si在亚毫米波(sub-mm wave)频率约0.35太赫兹(THz)下作为混合隧道雪崩穿越时间模式工作微波源的潜力。设计标准选择宽度,掺杂浓度,和面积突出。从我们的模拟结果中,我们观察到Si二极管产生的输出功率最小,为41 mW,其次是GaN二极管760 mW和SiC二极管2.89 W。此外,GaN二极管比SiC二极管(高出5 dB)和Si二极管(高出10 dB)具有更大的噪声。氮化镓和碳化硅二极管之间的巨大性能差异归因于氮化镓中不同载流子速度的结合,这是其他作者没有使用的。尽管与SiC二极管相比,GaN具有低功耗和高噪声的特点,但其均方噪声电压曲线中存在多个峰值,噪声测量曲线中存在多个极小值,这将为设计像DAR二极管那样具有多频调谐能力的GaN低噪声ATT二极管开辟新的方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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