K. Ogawa, Shin Suzuki, M. Sonehara, Toshiro Sato, K. Asanuma
{"title":"Optical probe current sensor module using the Kerr effect and its application to IGBT switching current measurements","authors":"K. Ogawa, Shin Suzuki, M. Sonehara, Toshiro Sato, K. Asanuma","doi":"10.1109/ICSENST.2011.6137050","DOIUrl":null,"url":null,"abstract":"An optical probe current sensor module using the Kerr effect has been fabricated and applied to switching current measurements for IGBT used for the DC-DC converter and the DC-AC inverter of EV/HEV. Since the sensor module using the Kerr effect of the single domain exchange-coupled magnetic thin film utilizes magnetization rotation only, the Barkhausen noise due to domain wall pinning can be excluded. The current sensor consists of a Laser-diode, a polarizer, a Fe-Si/Mn-Ir exchange-coupled film, a quarter-wavelength plate, a Glan-Laser polarizer, PIN Photodiodes and a differential amplifier. The optical probe current sensor has a current measurement range of ±60 A and a frequency range of DC - 200 kHz. The switching current of IGBT has been measured by it.","PeriodicalId":202062,"journal":{"name":"2011 Fifth International Conference on Sensing Technology","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Fifth International Conference on Sensing Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENST.2011.6137050","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
An optical probe current sensor module using the Kerr effect has been fabricated and applied to switching current measurements for IGBT used for the DC-DC converter and the DC-AC inverter of EV/HEV. Since the sensor module using the Kerr effect of the single domain exchange-coupled magnetic thin film utilizes magnetization rotation only, the Barkhausen noise due to domain wall pinning can be excluded. The current sensor consists of a Laser-diode, a polarizer, a Fe-Si/Mn-Ir exchange-coupled film, a quarter-wavelength plate, a Glan-Laser polarizer, PIN Photodiodes and a differential amplifier. The optical probe current sensor has a current measurement range of ±60 A and a frequency range of DC - 200 kHz. The switching current of IGBT has been measured by it.