M. Koledintseva, Amendra Koul, Fan Zhou, J. Drewniak, S. Hinaga
{"title":"Surface impedance approach to calculate loss in rough conductor coated with dielectric layer","authors":"M. Koledintseva, Amendra Koul, Fan Zhou, J. Drewniak, S. Hinaga","doi":"10.1109/ISEMC.2010.5711380","DOIUrl":null,"url":null,"abstract":"The analysis presented herein contains closed-form analytical expressions to calculate attenuation in a layered structure “rough metal-dielectric-dielectric”, which is a practically important problem in separating dielectric loss from rough conductor loss in actual PCB stripline geometries, when measuring dielectric constant (Dk) and dissipation factor (Df) using travelling wave S-parameter methods. This approach is based on the surface impedance concept. It is shown that the presence of an epoxy layer on the conductor may affect extracted dielectric parameters, of a PCB substrate, especially the Df data.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2010.5711380","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
The analysis presented herein contains closed-form analytical expressions to calculate attenuation in a layered structure “rough metal-dielectric-dielectric”, which is a practically important problem in separating dielectric loss from rough conductor loss in actual PCB stripline geometries, when measuring dielectric constant (Dk) and dissipation factor (Df) using travelling wave S-parameter methods. This approach is based on the surface impedance concept. It is shown that the presence of an epoxy layer on the conductor may affect extracted dielectric parameters, of a PCB substrate, especially the Df data.