Surface impedance approach to calculate loss in rough conductor coated with dielectric layer

M. Koledintseva, Amendra Koul, Fan Zhou, J. Drewniak, S. Hinaga
{"title":"Surface impedance approach to calculate loss in rough conductor coated with dielectric layer","authors":"M. Koledintseva, Amendra Koul, Fan Zhou, J. Drewniak, S. Hinaga","doi":"10.1109/ISEMC.2010.5711380","DOIUrl":null,"url":null,"abstract":"The analysis presented herein contains closed-form analytical expressions to calculate attenuation in a layered structure “rough metal-dielectric-dielectric”, which is a practically important problem in separating dielectric loss from rough conductor loss in actual PCB stripline geometries, when measuring dielectric constant (Dk) and dissipation factor (Df) using travelling wave S-parameter methods. This approach is based on the surface impedance concept. It is shown that the presence of an epoxy layer on the conductor may affect extracted dielectric parameters, of a PCB substrate, especially the Df data.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2010.5711380","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

The analysis presented herein contains closed-form analytical expressions to calculate attenuation in a layered structure “rough metal-dielectric-dielectric”, which is a practically important problem in separating dielectric loss from rough conductor loss in actual PCB stripline geometries, when measuring dielectric constant (Dk) and dissipation factor (Df) using travelling wave S-parameter methods. This approach is based on the surface impedance concept. It is shown that the presence of an epoxy layer on the conductor may affect extracted dielectric parameters, of a PCB substrate, especially the Df data.
表面阻抗法计算涂有介电层的粗糙导体损耗
本文的分析包含了计算“粗糙金属-介电-介电”层状结构中衰减的封闭解析表达式,这是在实际PCB带状线几何中,使用行波s参数法测量介电常数(Dk)和耗散因子(Df)时,将介电损耗与粗糙导体损耗分离的一个实际重要问题。这种方法是基于表面阻抗的概念。结果表明,导体上环氧层的存在会影响PCB基板的介电参数提取,尤其是Df数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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