Long-wavelength VCSELs: the case for all-epitaxial approaches

L. Coldren
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引用次数: 3

Abstract

For about a decade viable vertical-cavity surface emitting lasers (VCSELs) in the short wavelength 850-980 nm range have existed based upon the lattice matched InGaAs/AlGaAs/GaAs materials system. Reasonable devices extending into the visible (/spl sim/650 nm) have also been created more recently, generally using AlInGaP active layers. In most cases, devices are grown in a single epitaxial growth step, either by MBE or MOCVD approaches. In some cases, a top dielectric mirror has been employed, but the reliability of such approaches has not been fully verified. To date, all commercially successful devices have used all-epitaxial approaches. The paper reviews recent progress with the various approaches and focus in on the issues involved in the all-epitaxial approaches. From current progress, extrapolated levels of expected performance are also presented.
长波长VCSELs:全外延方法的案例
近十年来,基于晶格匹配InGaAs/AlGaAs/GaAs材料体系的垂直腔面发射激光器(VCSELs)在850 ~ 980 nm短波长范围内已经存在。合理的器件延伸到可见光(/spl sim/650纳米)也被创造了最近,一般使用AlInGaP有源层。在大多数情况下,通过MBE或MOCVD方法,器件在单个外延生长步骤中生长。在某些情况下,采用了顶部介质镜,但这种方法的可靠性尚未得到充分验证。迄今为止,所有商业上成功的器件都采用了全外延方法。本文综述了各种方法的最新进展,重点讨论了全外延方法中涉及的问题。根据目前的进展,还提出了外推的预期绩效水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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