On-chip analog signal testing using an undersampling approach

Abstract

Integrated Circuit (IC) manufacturing processes have been successful in introducing complex high speed analog and mixed signal devices. The paper presents a novel method of testing analog ICs using periodic input stimuli and wide band undersampling. In its simplest form, the testing procedure can be implemented in a design by adding two simple components on-chip: an analog switch to sample the response signal at a particular node under test, and a buffer to bring the sampled values off-chip. Using a sequential undersampling algorithm to control the switch allows high frequency signals to be mixed down in frequency and driven off-chip using a low bandwidth buffer.