Micromachined high aspect ratio coplanar waveguide with high impedance and low loss on low resistivity silicon

S. Todd, J. Bowers, N. MacDonald
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引用次数: 2

Abstract

A micromachining process has been developed to create high impedance and low loss high aspect ratio coplanar waveguide (HARC) on low resistivity silicon. The process uses silicon DRIE to create an array of tall mesas that are spaced with a precise pitch. The silicon mesa array is then merged into a single solid SiO2 mesa using thermal oxidation. The solid SiO2 mesa creates a wide dielectric for use in high impedance HARC. The complete fabrication process includes DRIE, thermal oxidation, electroplating, planarization, and substrate removal to create HARC on low resistivity silicon with a planar surface. A high impedance HARC has been fabricated on silicon using this method. Measurements show that silicon substrate removal increases the line impedance from 20 Ω to 57 Ω, reduces effective dielectric constant from 6 to 2, and reduces attenuation constant from 33 dB/cm to 4 dB/cm @ 30 GHz. Measurements are compared to an analytical model derived for HARC.
微机械高纵横比共面波导高阻抗低损耗低电阻硅
提出了一种在低电阻硅上制备高阻抗低损耗高纵横比共面波导的微加工工艺。该工艺使用硅驱动来创建一系列高的平台,这些平台以精确的间距间隔。然后使用热氧化将硅台面阵列合并为单个固体SiO2台面。固体SiO2台面为高阻抗HARC创造了宽介电介质。完整的制造过程包括DRIE,热氧化,电镀,平面化和衬底去除,以在具有平面的低电阻率硅上制造HARC。用这种方法在硅上制备了一个高阻抗HARC。测量结果表明,去除硅衬底使线路阻抗从20 Ω增加到57 Ω,有效介电常数从6降低到2,衰减常数从33 dB/cm降低到4 dB/cm @ 30 GHz。测量结果与为HARC导出的分析模型进行了比较。
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