Study of the influence of surface layer parameters on the level of their X-ray contrast

Abstract

Nano- and microdimensional tantalum surface layers were created on wire and flat NiTi substrates by magnetron sputtering. The samples structure and composition were determined using SEM and Auger spectroscopy. As the sputtering time increases, the thickness of the surface layer increases non-linearly, which leads to a change in the radiopacity of the material relative to the substrate. Based on the calculations of the coefficient of linear attenuation of X-ray radiation, it is shown that a layered composite in the form of a plate with a surface layer on only one side can be conditionally represented as a multicomponent monolith, but with a rounded sample section, a continuous surface layer surrounding it from all sides has a greater effect on radiopacity.