BackSpace: Formal Analysis for Post-Silicon Debug

F. M. D. Paula, Marcel Gort, A. Hu, S. Wilton, Jin Yang
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引用次数: 85

Abstract

Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can "backspace" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.
退格:后硅调试的形式化分析
后硅调试是当新设计的制造芯片行为不正确时确定错误的问题。这个问题现在消耗了大型设计的全部验证工作的一半以上,而且这个问题越来越严重。我们引入了一种新的范例,用于使用形式分析,并辅以一些片上硬件支持,以自动计算导致观察到的错误状态的错误跟踪,从而大大简化了硅后调试问题。我们的初步模拟实验证明了我们方法的潜力:我们可以从一些样本设计的随机选择状态中“退格”数百个周期。我们的初步架构研究提出了一些可能的实现,并表明片上开销是合理的。最后展望了未来的研究方向。
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