{"title":"Ruggedness and reliability of lead free electronics","authors":"J. E. Starr","doi":"10.1109/RAMS.2010.5447988","DOIUrl":null,"url":null,"abstract":"Little is understood about the behavior of new lead-free solders in harsh mechanical environments (shock and vibration). There is an interest in scientific understanding of the impact of lead-free electronics and an interest in mitigating lead-free reliability risks. Reliability under harsh environments has two primary needs - 1) ability to ruggedize the product for the expected environment and 2) ability to effectively screen to prevent production flawed parts from being shipped.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2010.5447988","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Little is understood about the behavior of new lead-free solders in harsh mechanical environments (shock and vibration). There is an interest in scientific understanding of the impact of lead-free electronics and an interest in mitigating lead-free reliability risks. Reliability under harsh environments has two primary needs - 1) ability to ruggedize the product for the expected environment and 2) ability to effectively screen to prevent production flawed parts from being shipped.