Material Characterization by the Inversion of V(z)

K. Liang, G. Kino, B. Khuri-Yakub
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引用次数: 169

Abstract

Absfmet-It is demonstrated that the reflectance function R(@) of a liquid-solid interface can be obtained by inverting the complex V(z) data collected with an acoustic microscope. The inversion algorithm is based on a nonparaxial formulation of the V(z) integral, which establishes the Fourier transform relation between R(@) and V(z). Examples are given to show that with this measurement technique, the acoustic phase velocities of the propagating modes in the solid medium can easily be determined and material losses can be estimated. The same technique is also used for characterizing imaging performance of focused systems. Applications In thin-6lm measurement are also discussed.
用V(z)反演表征材料
摘要:通过对声学显微镜采集的V(z)复数据进行反演,得到了液固界面的反射函数R(@)。反演算法基于V(z)积分的非傍轴公式,该公式建立了R(@)和V(z)之间的傅里叶变换关系。算例表明,利用这种测量技术可以很容易地确定固体介质中传播模式的声相速度,并可以估计材料损失。同样的技术也用于表征聚焦系统的成像性能。还讨论了在薄6lm测量中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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