{"title":"Material Characterization by the Inversion of V(z)","authors":"K. Liang, G. Kino, B. Khuri-Yakub","doi":"10.1109/T-SU.1985.31587","DOIUrl":null,"url":null,"abstract":"Absfmet-It is demonstrated that the reflectance function R(@) of a liquid-solid interface can be obtained by inverting the complex V(z) data collected with an acoustic microscope. The inversion algorithm is based on a nonparaxial formulation of the V(z) integral, which establishes the Fourier transform relation between R(@) and V(z). Examples are given to show that with this measurement technique, the acoustic phase velocities of the propagating modes in the solid medium can easily be determined and material losses can be estimated. The same technique is also used for characterizing imaging performance of focused systems. Applications In thin-6lm measurement are also discussed.","PeriodicalId":371797,"journal":{"name":"IEEE Transactions on Sonics and Ultrasonics","volume":"327 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"169","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Sonics and Ultrasonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/T-SU.1985.31587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 169
Abstract
Absfmet-It is demonstrated that the reflectance function R(@) of a liquid-solid interface can be obtained by inverting the complex V(z) data collected with an acoustic microscope. The inversion algorithm is based on a nonparaxial formulation of the V(z) integral, which establishes the Fourier transform relation between R(@) and V(z). Examples are given to show that with this measurement technique, the acoustic phase velocities of the propagating modes in the solid medium can easily be determined and material losses can be estimated. The same technique is also used for characterizing imaging performance of focused systems. Applications In thin-6lm measurement are also discussed.