Hyeongyu Kim, Kyung Won Kim, K. Lee, Taejoon Eo, K. Lee, Yohan Jun, Seung Ah Lee, D. Hwang
{"title":"Deep residual network with data consistency for subsampled Fourier ptychographic microscopy","authors":"Hyeongyu Kim, Kyung Won Kim, K. Lee, Taejoon Eo, K. Lee, Yohan Jun, Seung Ah Lee, D. Hwang","doi":"10.1117/12.2609572","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":335392,"journal":{"name":"Quantitative Phase Imaging VIII","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quantitative Phase Imaging VIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2609572","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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