Investigating the Formation of X-Pinches Using L-Shell Time Resolved Spectroscopy

A. Elshafiey, S. Pikuz, T. Shelkovenko, D. Hammer
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Abstract

The results of L-shell spectroscopic analyses of Hybrid X-pinches (HXPs) employing an X-ray streak camera with a 10ps time resolution are presented. The goal of these experiments is to determine the plasma properties throughout the formation process of the X-pinch bright X-ray spots (hotspots). The most studied radiation from hotspots is K-shell radiation, although as previously demonstrated using streak cameras, K-shell radiation begins with a strong continuum followed by emission lines, which occur during the moment of maximum compression and the expansion phase respectively. [1] L-shell radiation can occur earlier in time as the temperature and density requirements are substantially lower, hence they can be used to shine a light on the early compression phase before maximum compression is reached. The experiments were conducted using the XP pulsed power machine with a current of 250-350kA and a rise time of 50ns. A variety of diagnostics in addition to a streaked X-ray spectrograph, including silicon diodes and PCDs, which were used to examine the L and K-shell emissions in time using an 8Ghz oscilloscope.
利用l -壳层时间分辨光谱研究x -夹束的形成
本文介绍了在10ps时间分辨率的x射线条纹相机上对混合x -夹缝(HXPs)进行l -壳光谱分析的结果。这些实验的目的是确定在X-pinch亮x射线点(热点)形成过程中的等离子体特性。热点地区研究最多的辐射是k壳辐射,尽管正如之前使用条纹相机所证明的那样,k壳辐射开始于一个强连续体,随后是发射线,分别发生在最大压缩时刻和膨胀阶段。[1]由于温度和密度要求较低,l壳辐射可以发生得更早,因此它们可以在达到最大压缩之前的早期压缩阶段发光。实验采用XP脉冲功率机,电流为250 ~ 350ka,上升时间为50ns。除了条纹x射线光谱仪之外,还使用了多种诊断方法,包括硅二极管和PCDs,使用8Ghz示波器及时检查L和k壳的发射。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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