A SAT-based algorithm for reparameterization in symbolic simulation

P. Chauhan, E. Clarke, D. Kroening
{"title":"A SAT-based algorithm for reparameterization in symbolic simulation","authors":"P. Chauhan, E. Clarke, D. Kroening","doi":"10.1145/996566.996711","DOIUrl":null,"url":null,"abstract":"Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one parametric representation to another smaller representation, in a process called reparameterization. For large circuits, the reparametrization step often results in a blowup of BDDs and is expensive due to a large number of quantifications of input variables involved. Efficient SAT solvers have been applied successfully for many verification problems. This paper presents a novel SAT-based reparameterization algorithm that is largely immune to the large number of input variables that need to be quantified. We show experimental results on large industrial circuits and compare our new algorithm to both SAT-based Bounded Model Checking and BDD based symbolic simulation. We were able to achieve on average 3x improvement in time and space over BMC and able to complete many examples that BDD based approach could not even finish.","PeriodicalId":115059,"journal":{"name":"Proceedings. 41st Design Automation Conference, 2004.","volume":"217 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 41st Design Automation Conference, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/996566.996711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

Abstract

Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one parametric representation to another smaller representation, in a process called reparameterization. For large circuits, the reparametrization step often results in a blowup of BDDs and is expensive due to a large number of quantifications of input variables involved. Efficient SAT solvers have been applied successfully for many verification problems. This paper presents a novel SAT-based reparameterization algorithm that is largely immune to the large number of input variables that need to be quantified. We show experimental results on large industrial circuits and compare our new algorithm to both SAT-based Bounded Model Checking and BDD based symbolic simulation. We were able to achieve on average 3x improvement in time and space over BMC and able to complete many examples that BDD based approach could not even finish.
符号仿真中基于sat的重参数化算法
用于电路符号仿真的参数表示通常使用bdd。经过几个步骤的符号模拟后,状态集表示从一种参数表示转换为另一种较小的表示,这个过程称为重新参数化。对于大型电路,重参数化步骤通常会导致bdd的爆炸,并且由于涉及大量输入变量的量化,成本很高。高效的SAT求解器已成功地应用于许多验证问题。本文提出了一种新的基于sat的再参数化算法,该算法在很大程度上不受需要量化的大量输入变量的影响。我们展示了在大型工业电路上的实验结果,并将我们的新算法与基于sat的有界模型检查和基于BDD的符号仿真进行了比较。我们能够在时间和空间上实现比BMC平均3倍的改进,并且能够完成许多基于BDD的方法甚至无法完成的示例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信