Design space exploration of high-speed busses using statistical methods

Abstract

This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.