Raman spectroscopy of Si/sub x/Ge/sub 1-x/ compositional and temperature dependence

M. Lorenc, J. Šik
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Abstract

Raman spectroscopy is employed to study the compositional and temperature dependence of optical phonon modes in Si/sub x/Ge/sub 1-x/(0.0037/spl les/./spl times//spl les/1) alloy. Czochralski grown samples are doped in the range from nominally undoped to heavily boron doped, with the highest concentration of free holes of 10/sup 20/ cm/sup -3/. Three observed bands can be attributed to local Si-Si, Ge-Ge and Si-Ge vibrational modes. We present compositional dependence and temperature shift of the Si-Si band.
Si/sub -x/ Ge/sub - 1-x/组分和温度依赖性的拉曼光谱
利用拉曼光谱研究了Si/sub -x/ Ge/sub - 1-x/(0.0037/spl les/)中光学声子模的组成和温度依赖关系。/spl times//spl les/1) alloy。Czochralski生长样品的掺杂范围从名义上未掺杂到重度掺杂,自由空穴的最高浓度为10/sup 20/ cm/sup -3/。观测到的三个波段可归因于局域Si-Si、Ge-Ge和Si-Ge振动模式。我们研究了Si-Si波段的组分依赖性和温度变化。
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