Analysis of cascading failure of circuit systems based on load-capacity model of complex network

Youjiang Fan, Yang Cheng, Yunxia Chen, Yi Yang
{"title":"Analysis of cascading failure of circuit systems based on load-capacity model of complex network","authors":"Youjiang Fan, Yang Cheng, Yunxia Chen, Yi Yang","doi":"10.1109/ICRSE.2017.8030769","DOIUrl":null,"url":null,"abstract":"Cascading failure are common in the large scale circuit system. We apply a cascading failure model to a circuit system, which is based on the flow redistribution. The vulnerability and robustness of a circuit system is studied by using the model under two initial failures: the random failure and the max-load failure. The results show that a single-point failure can influence the system performance, especially the failure happens to the component having relative large load. That is important and useful to provide theoretical guidance of circuit design optimization.","PeriodicalId":317626,"journal":{"name":"2017 Second International Conference on Reliability Systems Engineering (ICRSE)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Second International Conference on Reliability Systems Engineering (ICRSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRSE.2017.8030769","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Cascading failure are common in the large scale circuit system. We apply a cascading failure model to a circuit system, which is based on the flow redistribution. The vulnerability and robustness of a circuit system is studied by using the model under two initial failures: the random failure and the max-load failure. The results show that a single-point failure can influence the system performance, especially the failure happens to the component having relative large load. That is important and useful to provide theoretical guidance of circuit design optimization.
基于复杂网络负载容量模型的电路系统级联故障分析
级联故障是大型电路系统中常见的故障。将基于流量再分配的级联故障模型应用于电路系统。利用该模型研究了电路系统在随机失效和最大负荷失效两种初始失效情况下的脆弱性和鲁棒性。结果表明,单点故障会影响系统的性能,特别是在负载较大的部件上发生故障。这对电路优化设计提供了重要的理论指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信