Evaluation of detectability in BIST environment

Abstract

Built-in self-test (BIST) technique is now widely applied. How to estimate its testing capabilities is an important problem. BIST detectability is defined as the probability of that a fault set of the circuit-under-test is detected. It depends on the properties of the test at, circuit-under-test, as well as the signature analyser as a data compressor. The detectability of a signature analyzer is evaluated. The random and pseudorandom testing techniques are examined for their BIST detectability and several results are derived.<>