On the minimal test set for single fault location

Abstract

A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<>