A new BIST approach for delay fault testing

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC Pub Date : 1994-02-28 DOI:10.1109/EDTC.1994.326863

A. Vuksic, K. Fuchs

引用次数: 28

Abstract

A new built-in self testing (BIST) method for the detection of delay faults is proposed. It is shown that all possible pattern pairs can be generated with a MISR using all input combinations. In order to reduce the test pattern set, deterministic delay test generation is used and a minimal set of input vectors is derived via clique covering. Experimental results show that by just using the all-0 and all-1 input vectors, the non-robust path delay fault coverage ranges from 85% to 100%.<>

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时延故障检测的一种新方法

提出了一种新的基于内置自检测的延迟故障检测方法。结果表明，使用所有输入组合，MISR可以生成所有可能的模式对。为了减少测试模式集，采用确定性延迟测试生成，并通过团覆盖导出最小输入向量集。实验结果表明，仅使用全0和全1输入向量时，非鲁棒路径延迟故障覆盖率在85% ~ 100%之间。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC

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