Rapid Identification and Characterization of Laser Injected Clock Faults through OBIC Mapping

Abstract

Clock glitching is a powerful tool for security analysis of embedded devices. It can be difficult to introduce this type of fault, especially when the clock is driven internally. For this reason, Laser Fault Injection (LFI) is attractive as a method to induce glitches in clocking behavior of a device. In this paper, we outline a methodology for rapidly mapping the silicon features utilized by an FPGA design, identifying areas of interest from that map, performing LFI testing, and characterizing the injected faults. By using this framework, we identify three unique faulting behaviors of the internal clock for the Xilinx Spartan 6 FPGA.