{"title":"Supercomputer reliability and mitigation","authors":"R. Ogan","doi":"10.1109/SECON.2017.7925285","DOIUrl":null,"url":null,"abstract":"Reliability, Availability and Serviceability (RAS) are key to high performance computing. Because of the relatively high costs of supercomputers and the required support needed to operate these systems, a holistic approach must be taken to assure system reliability as defined: Reliability is the probability that a material, component, or system will perform its intended function under defined operating conditions for a specific period of time. Extension of the computer system lifetime will be achieved through the implementation of built-in-test-equipment (BITE) monitoring that will provide the required feedback for optimum environmental controls. Reliability improvements of MTBF of 25% have been predicted based upon redesign of the microprocessor cooling system to reduce average case temperatures from 90 °C to 75 °C","PeriodicalId":368197,"journal":{"name":"SoutheastCon 2017","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SoutheastCon 2017","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2017.7925285","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Reliability, Availability and Serviceability (RAS) are key to high performance computing. Because of the relatively high costs of supercomputers and the required support needed to operate these systems, a holistic approach must be taken to assure system reliability as defined: Reliability is the probability that a material, component, or system will perform its intended function under defined operating conditions for a specific period of time. Extension of the computer system lifetime will be achieved through the implementation of built-in-test-equipment (BITE) monitoring that will provide the required feedback for optimum environmental controls. Reliability improvements of MTBF of 25% have been predicted based upon redesign of the microprocessor cooling system to reduce average case temperatures from 90 °C to 75 °C