Implementation of a Modified Model-SRAM Using Tanner EDA

C. Singh, A. Grover, Neeti Grover
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引用次数: 5

Abstract

Due to the increased demand of SRAM with large use of SRAM in System On-Chip, the oxide thickness has become a tough challenge in CMOS technology. The leakage power also affects the chip design process. Speed of SRAM and Power consumption are also taken care of for designing a chip. This article represents the simulation of 6T SRAM; Asymmetric SRAM cells using low power reduction techniques. All the simulations have been carried out on 180nm at Tanner EDA tool. In this article, SRAM cell will includes one more extra transistor that will control the overall capacitances during the write and read operation and will optimize the total capacitance that results in decrease in the power dissipation. The circuit verification is done on the Tanner tool, Schematic of the SRAM cell is designed on the S Edit and net list simulation done by using T-spice and waveforms are analyzed through the W-edit.
一种改进型sram的Tanner EDA实现
随着SRAM在片上系统中的大量应用,对SRAM的需求不断增加,氧化物厚度已成为CMOS技术的一个严峻挑战。泄漏功率也会影响芯片的设计过程。在设计芯片时,SRAM的速度和功耗也被考虑在内。本文介绍了6T SRAM的仿真;采用低功耗降低技术的非对称SRAM单元。所有仿真均在Tanner EDA工具的180nm上进行。在本文中,SRAM单元将包括一个额外的晶体管,该晶体管将在写入和读取操作期间控制总电容,并将优化总电容,从而降低功耗。在Tanner工具上进行了电路验证,在S - Edit上设计了SRAM单元的原理图,使用T-spice进行了网表仿真,并通过W-edit对波形进行了分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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