On the Active Clamp Gate Driver Thermal Effects

L. Rubino, G. Rubino
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引用次数: 1

Abstract

The IGBT active clamp gate driver is a conveniently method used to protect the switch from the overvoltage by driving the gate input of the IGBT itself. The overvoltage is common during the turn-off of inductive loads or circuits with parasitic elements. This clamping circuit is generally embed into the gate driver circuits. The aim of this paper is to study and model the active clamp circuit giving a compact mathematical model for the power losses calculation. The losses calculation are needed for the heatsink sizing when the system is used in not conventional use, with single or repetitive overvoltages, as for example for the solid state circuit breakers (SSCB) without external passive clamp circuits. Moreover the study has been validated with experimental tests.
有源箝位栅极驱动器的热效应研究
IGBT有源箝位栅极驱动器是一种通过驱动IGBT本身的栅极输入来保护开关免受过电压影响的方便方法。过电压在关断感性负载或带有寄生元件的电路时很常见。这种箝位电路通常嵌入到栅极驱动电路中。本文的目的是对有源箝位电路进行研究和建模,给出了一个紧凑的计算功率损耗的数学模型。当系统用于非常规用途时,具有单个或重复过电压,例如没有外部无源钳位电路的固态断路器(SSCB),则需要计算散热片尺寸的损耗。并通过实验验证了研究结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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