M. Savin, A. Grishko, V. Zuev, I. Kochegarov, E.M. Solov'eva
{"title":"ANALYSIS OF FAILURES OF FIELD-EFFECT TRANSISTORS WHEN MONITORING THE OPERABILITY OF THE DEVICE BY INDIRECT PARAMETERS","authors":"M. Savin, A. Grishko, V. Zuev, I. Kochegarov, E.M. Solov'eva","doi":"10.21685/2307-4205-2022-1-10","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":119404,"journal":{"name":"Reliability & Quality of Complex Systems","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability & Quality of Complex Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21685/2307-4205-2022-1-10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}