H. Akasaka, S. Tunmee, U. Rittihong, Masashi Tomidokoro, C. Euaruksakul, Ratchadaporn Supruangne, H. Nakajima, Sota Norizuki, Y. Hirata, N. Ohtake
{"title":"Investigation of Damage area on DLC film surface using X-ray Photoemission Electron Microscopy","authors":"H. Akasaka, S. Tunmee, U. Rittihong, Masashi Tomidokoro, C. Euaruksakul, Ratchadaporn Supruangne, H. Nakajima, Sota Norizuki, Y. Hirata, N. Ohtake","doi":"10.1299/jsmemp.2019.27.206","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":437494,"journal":{"name":"The Proceedings of the Materials and processing conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Proceedings of the Materials and processing conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1299/jsmemp.2019.27.206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
