Optimisation of Schottky electrode geometry

S. Luong, M. Alnassar, Pan Yue, A. Holland
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引用次数: 1

Abstract

The geometry of the Schottky contact electrode is important in the design of Schottky power diodes. This work focuses on the optimum shape of the Schottky contact geometry and uses finite element modeling to determine the effects of the shape on electrical characteristics of a diode. The investigation considers the typical situation where the contact is smaller than the substrate area. Simulations were run with different shapes ranging from perfect square to perfect circle with the size of the diode substrate (die) and the distance between the edge of the diode and edge of the Schottky contact as a constant. The different models were examined and compared with magnitude the occurrence of the maximum current density (for a particular output current) and hence the breakdown regions at current density approaching the critical value for breakdown (most likely destruction of a diode) due to high current density. There as an optimum geometry determined for the highest current that the given diode substrate could deliver. The results clearly show that the optimum geometry for the Schottky contact should be neither perfect square nor perfect circle, but an exact geometry in between. This optimum geometry gives the optimum distribution of current density around the edge of the Schottky contact. Investigation is done using Synopsys TCAD. The forward and reverse bias situations were investigated to optimize the electrode geometry.
肖特基电极几何结构的优化
肖特基接触电极的几何形状在肖特基功率二极管的设计中很重要。这项工作的重点是肖特基接触几何的最佳形状,并使用有限元建模来确定形状对二极管电特性的影响。研究考虑了接触面积小于衬底面积的典型情况。以二极管衬底(晶片)的尺寸和二极管边缘与肖特基触点边缘之间的距离为常数,对从正方形到正圆形的不同形状进行了模拟。对不同的模型进行了检查,并与最大电流密度(对于特定的输出电流)的发生幅度进行了比较,因此,由于高电流密度,电流密度接近击穿(极有可能破坏二极管)的临界值时的击穿区域。对于给定二极管衬底可以提供的最大电流,确定了最佳几何形状。结果清楚地表明,肖特基接触的最佳几何形状既不是完美的正方形,也不是完美的圆形,而是介于两者之间的精确几何形状。这种最佳几何形状给出了肖特基接触边缘周围电流密度的最佳分布。使用Synopsys TCAD进行调查。研究了正向偏压和反向偏压的情况,以优化电极的几何形状。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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