A high quality 1-V Josephson series array developed at KRISS

Abstract

By combining the selective niobium anodization process (SNAP) and the image reversal technique (IRT) a new fabrication process of integrated Josephson series array has been developed at KRISS. The array containing 2520 Nb/Al/sub 2/O/sub 3//Nb tunnel junctions produced stable quantized voltage steps up to 2 V with stability times of more than 5-h.<>