Esteban Jove, J. Casteleiro-Roca, Héctor Quintián-Pardo, D. Simić, J. A. M. Pérez, J. Calvo-Rolle
{"title":"Anomaly detection based on one-class intelligent techniques over a control level plant","authors":"Esteban Jove, J. Casteleiro-Roca, Héctor Quintián-Pardo, D. Simić, J. A. M. Pérez, J. Calvo-Rolle","doi":"10.1093/jigpal/jzz057","DOIUrl":null,"url":null,"abstract":"A large part of technological advances, especially in the field of industry, have been focused on the optimization of productive processes. However, the detection of anomalies has turned out to be a great challenge in fields like industry, medicine or stock markets. The present work addresses anomaly detection on a control level plant. We propose the application of different intelligent techniques, which allow to obtain one-class classifiers using real data taken from the correct plant operation. The performance of each classifier is assessed and validated with real created faults, achieving successful overall results.","PeriodicalId":304915,"journal":{"name":"Log. J. IGPL","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Log. J. IGPL","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1093/jigpal/jzz057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
A large part of technological advances, especially in the field of industry, have been focused on the optimization of productive processes. However, the detection of anomalies has turned out to be a great challenge in fields like industry, medicine or stock markets. The present work addresses anomaly detection on a control level plant. We propose the application of different intelligent techniques, which allow to obtain one-class classifiers using real data taken from the correct plant operation. The performance of each classifier is assessed and validated with real created faults, achieving successful overall results.