Thermoelectric properties of Ba-filled Si-Ge alloy type I semiconducting clathrates

J. Martín, S. Erickson, G. Nolas, P. Alboni, T. Tritt
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引用次数: 1

Abstract

We report the synthesis of the Si-Ge alloy type I clathrate Ba/sub 8/Ga/sub 16/Si/sub x/Ge/sub 30-x/ including a systematic investigation of the electrical properties by varying the Si-to-Ge ratio while a constant Ga-to-group IV element ratio is maintained. These Si-Ge type I clathrate samples demonstrate transport properties in direct contrast to those expected in a typical rigid band semiconducting material. The increasing Si substitution correlates to an increase in |S| even as the resistivity decreases and the carrier concentration increases, suggesting a modified band structure as compared to Ba/sub 8/Ga/sub 16/Ge/sub 30/. The structural, chemical, and electrical transport properties of Ba/sub 8/Ga/sub 16/Si/sub x/Ge/sub 30-x/ are reported in comparison to Ba/sub 8/Ga/sub 16/Ge/sub 30/ and Sr/sub 8/Ga/sub 16/Si/sub x/Ge/sub 30-x/.
ba填充Si-Ge合金I型半导体包合物的热电性能
本文报道了Si-Ge合金I型包合物Ba/sub - 8/Ga/sub - 16/Si/sub -x/ Ge/sub - 30-x/的合成,并通过改变Si-Ge比对其电性能进行了系统的研究,同时保持了恒定的Ga- IV族元素比。这些Si-Ge I型包合物样品的输运性质与典型的刚性带半导体材料的输运性质直接相反。随着电阻率的降低和载流子浓度的增加,Si取代量的增加与S的增加相关,表明与Ba/sub 8/Ga/sub 16/Ge/sub 30/相比,其能带结构发生了改变。与Ba/sub 8/Ga/sub 16/Si/sub x/Ge/sub 30-x/和Sr/sub 8/Ga/sub 16/Si/sub x/Ge/sub 30-x/的结构、化学和电输运性质进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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