Mengfu Di, Weiquan Hao, Xunyu Li, Zijin Pan, Runyu Miao, Albert Z. Wang
{"title":"A 38GHz SPDT Traveling Wave Switch with 5A CDM ESD Protection in 45nm PDSOI for 5G System","authors":"Mengfu Di, Weiquan Hao, Xunyu Li, Zijin Pan, Runyu Miao, Albert Z. Wang","doi":"10.1109/RWS55624.2023.10046341","DOIUrl":null,"url":null,"abstract":"This paper presents co-design and analysis of a 38GHz traveling wave single-pole double-through (SPDT) RF switch with robust ESD protection implemented in 45nm PDSOI technology 5G systems in millimeter-wave bands. Substrate coupling is minimized by a buried oxide (BOX) layer. The original switches exhibit insertion loss (IL) of −1.4dB and isolation (Iso) of ~59dB at 38GHz. The design goal of robust charged device model (CDM) ESD protection was realized, achieving ~5A in measurement. Human body model (HBM) ESD of ~2KV was also achieved. The ESD-protected SPDT achieves IL of −3.49dB and Iso of −49dB at 38GHz. Design analysis reveals significant impact of ESD protection on SPDT performance, which was minimized through careful co-design effort, improving insertion loss by ~0.8dB at 38GHz.","PeriodicalId":110742,"journal":{"name":"2023 IEEE Radio and Wireless Symposium (RWS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Radio and Wireless Symposium (RWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RWS55624.2023.10046341","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents co-design and analysis of a 38GHz traveling wave single-pole double-through (SPDT) RF switch with robust ESD protection implemented in 45nm PDSOI technology 5G systems in millimeter-wave bands. Substrate coupling is minimized by a buried oxide (BOX) layer. The original switches exhibit insertion loss (IL) of −1.4dB and isolation (Iso) of ~59dB at 38GHz. The design goal of robust charged device model (CDM) ESD protection was realized, achieving ~5A in measurement. Human body model (HBM) ESD of ~2KV was also achieved. The ESD-protected SPDT achieves IL of −3.49dB and Iso of −49dB at 38GHz. Design analysis reveals significant impact of ESD protection on SPDT performance, which was minimized through careful co-design effort, improving insertion loss by ~0.8dB at 38GHz.