Jochen De Weerdt, M. D. Backer, J. Vanthienen, B. Baesens
{"title":"A robust F-measure for evaluating discovered process models","authors":"Jochen De Weerdt, M. D. Backer, J. Vanthienen, B. Baesens","doi":"10.1109/CIDM.2011.5949428","DOIUrl":null,"url":null,"abstract":"Within process mining research, one of the most important fields of study is process discovery, which can be defined as the extraction of control-flow models from audit trails or information system event logs. The evaluation of discovered process models is an essential but difficult task for any process discovery analysis. With this paper, we propose a novel approach for evaluating discovered process models based on artificially generated negative events. This approach allows for the definition of a behavioral F-measure for discovered process models, which is the main contribution of this paper.","PeriodicalId":211565,"journal":{"name":"2011 IEEE Symposium on Computational Intelligence and Data Mining (CIDM)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"117","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE Symposium on Computational Intelligence and Data Mining (CIDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIDM.2011.5949428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 117
Abstract
Within process mining research, one of the most important fields of study is process discovery, which can be defined as the extraction of control-flow models from audit trails or information system event logs. The evaluation of discovered process models is an essential but difficult task for any process discovery analysis. With this paper, we propose a novel approach for evaluating discovered process models based on artificially generated negative events. This approach allows for the definition of a behavioral F-measure for discovered process models, which is the main contribution of this paper.